The ITP Stylus Extension in titanium provides a compact, high-rigidity extension for stylus-based metrology. Designed for CMM and probe systems, it extends reach into tight workpiece areas while keeping styli from interfering with one another.

• Material: Titanium stem offering excellent stiffness, light weight, and corrosion resistance.
• Overall Length: 80 mm to reach hard-to-access zones without sacrificing rigidity.
• Thread: M5 interface compatible with standard stylus housings.
• Connection Design: Minimal screw connection points to maximize stiffness and minimize potential interference.
• Application: Ideal for metrology setups where clear reach and clean measurement paths are essential.

This extension helps you measure complex or recessed features by providing a stable, direct path for the stylus. The titanium construction reduces deflection under load, supporting more reliable data in tight fixtures, while the streamlined design keeps multiple styli from colliding during setup and operation. Use it to improve accessibility, maintain measurement accuracy, and simplify probe configurations in demanding metrology tasks.